https://doi.org/10.1140/epja/i2008-10623-5
Regular Article — Experimental Physics
Precise half-life measurement of the 26Si ground state
1
Centre d’Études Nucléaires de Bordeaux Gradignan, Université Bordeaux 1-UMR 5797 CNRS/IN2P3, Chemin du Solarium, BP 120, F-33175, Gradignan Cedex, France
2
Instituto Estructura de la Materia, CSIC, Serrano 113bis, cE-28006, Madrid, Spain
3
Department of Physics, University of Jyväskylä, P.O. Box 35, FI-40014, Jyväskylä, Finland
4
CERN, CH-1211, Geneva 23, Switzerland
* e-mail: matea@cenbg.in2p3.fr
Received:
22
January
2008
Revised:
26
May
2008
Published online:
28
July
2008
The β-decay half-life of 26Si was measured with a relative precision of 1.4·10−3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision of 3%. The experiment was done at the Accelerator Laboratory of the University of Jyväskylä where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
PACS: 21.10.-k Properties of nuclei; nuclear energy levels – / 21.10.Tg Lifetimes, widths – / 23.40.Bw Weak-interaction and lepton (including neutrino) aspects – / 27.30.+t 20 ≤ A ≤ 38 –
© SIF, Springer-Verlag Berlin Heidelberg, 2008
